Direct Ionization Impact on Accelerator Mixed-Field Soft-Error Rate

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Authors: Ruben Garcia Alia, Maris Tali, Markus Brugger, Matteo Cecchetto, Francesco Cerutti, Andrea Cononetti, Salvatore Danzeca, Luigi Esposito, Pablo Fernandez-Martinez, Simone Gilardoni, Angelo Infantino, Maria Kastriotou, Nourdine Kerboub, Giuseppe Lerner, Vanessa Wyrwoll, Veronique Ferlet-Cavrois, Cesar Boatella, Arto Javanainen, Heikki Kettunen, Yolanda Morilla, Pedro Martin-Holgado, Remi Gaillard, F

Journal title: IEEE Transactions on Nuclear Science

Journal number: 67/1

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2020

Published pages: 345-352

DOI identifier: 10.1109/tns.2019.2951307

ISSN: 0018-9499