Development and evaluation of a flexible instrumentation layer for system-level testing of radiation effects 

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Authors: Israel C. Lopes, V. Pouget, F. Wrobel, A. Touboul, F. Saigne and K. Røed

Journal title: 2020 IEEE Latin-American Test Symposium (LATS)

Journal publisher: IEEE

Published year: 2020

DOI identifier: 10.1109/lats49555.2020.9093681

ISBN: 978-1-7281-8732-7