Investigating the Impact of Radiation-Induced Soft Errors on the Reliability of Approximate Computing Systems

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Authors: Lucas Matana Luza, Daniel Soderstrom, Georgios Tsiligiannis, Helmut Puchner, Carlo Cazzaniga, Ernesto Sanchez, Alberto Bosio, Luigi Dilillo

Journal title: 2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

Journal publisher: IEEE

Published year: 2020

Published pages: 1-6

DOI identifier: 10.1109/dft50435.2020.9250865

ISBN: 978-1-7281-9457-8