Comparison of the Total Ionizing Dose Sensitivity of a System in Package Point of Load Converter Using Both Component- and System-Level Test Approaches

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Authors: Tomasz Rajkowski, Frédéric Saigné, Kimmo Niskanen, Jérôme Boch, Tadec Maraine, Pierre Kohler, Patrick Dubus, Antoine Touboul, Pierre-Xiao Wang

Journal title: Electronics

Journal number: 10/11

Journal publisher: MDPI

Published year: 2021

Published pages: 1235

DOI identifier: 10.3390/electronics10111235

ISSN: 2079-9292