Microprocessor Error Diagnosis by Trace Monitoring under Laser Testing

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Authors: M. Pena-Fernandez, A. Lindoso, L. Entrena, I. Lopes, V. Pouget

Journal title: IEEE Transactions on Nuclear Science

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2021

Published pages: 1-1

DOI identifier: 10.1109/tns.2021.3067554

ISSN: 0018-9499