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Authors: Y.Q. Aguiar, F. Wrobel, J.-L. Autran, P. Leroux, F. Saigné, V. Pouget, A.D. Touboul
Journal title: Microelectronics Reliability
Journal number: 114
Journal publisher: Elsevier BV
Published year: 2020
Published pages: 113877
DOI identifier: 10.1016/j.microrel.2020.113877
ISSN: 0026-2714