Electron-Induced Upsets and Stuck Bits in SDRAMs in the Jovian Environment

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Authors: Daniel Soderstrom, Lucas Matana Luza, Heikki Kettunen, Arto Javanainen, Wilfrid Farabolini, Antonio Gilardi, Andrea Coronetti, Christian Poivey, Luigi Dilillo

Journal title: IEEE Transactions on Nuclear Science

Journal number: 68/5

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2021

Published pages: 716-723

DOI identifier: 10.1109/tns.2021.3068186

ISSN: 0018-9499