Impact of Complex Logic Cell Layout on the Single-Event Transient Sensitivity

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Authors: Y. Q. Aguiar, F. Wrobel, J.-L. Autran, P. Leroux, F. Saigne, A. D. Touboul, V. Pouget

Journal title: IEEE Transactions on Nuclear Science

Journal number: 66/7

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2019

Published pages: 1465-1472

DOI identifier: 10.1109/tns.2019.2918077

ISSN: 0018-9499