RADSAGA-604213 Analysis of the charge sharing effect in the SET sensitivity of bulk 45 nm standard cell layouts under heavy ions

Summary

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: Y.Q. Aguiar, F. Wrobel, J.-L. Autran, P. Leroux, F. Saigné, A.D. Touboul, V. Pouget

Journal title: Microelectronics Reliability

Journal number: 88-90

Journal publisher: Elsevier BV

Published year: 2018

Published pages: 920-924

DOI identifier: 10.1016/j.microrel.2018.07.018

ISSN: 0026-2714

Associated projects

RADSAGA - RADiation and reliability challenges for electronics used in Space, Avionics, on the Ground and at Accelerators

Organisations

Not specified

Analysis of the charge sharing effect in the SET sensitivity of bulk 45 nm standard cell layouts under heavy ions

Analysis of the charge sharing effect in the SET sensitivity of bulk 45 nm standard cell layouts under heavy ions