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Authors: Y.Q. Aguiar, F. Wrobel, J.-L. Autran, P. Leroux, F. Saigné, A.D. Touboul, V. Pouget
Journal title: Microelectronics Reliability
Journal number: 88-90
Journal publisher: Elsevier BV
Published year: 2018
Published pages: 920-924
DOI identifier: 10.1016/j.microrel.2018.07.018
ISSN: 0026-2714