"An SRAM-Based Radiation Monitor With Dynamic Voltage Control in 0.18-<inline-formula> <tex-math notation=""LaTeX"">$\mu$ </tex-math> </inline-formula>m CMOS Technology"

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Authors: Jeffrey Prinzie, Sam Thys, Bjorn Van Bockel, Jialei Wang, Valentijn De Smedt, Paul Leroux

Journal title: IEEE Transactions on Nuclear Science

Journal number: 66/1

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2019

Published pages: 282-289

DOI identifier: 10.1109/tns.2018.2885693

ISSN: 0018-9499