Aging and gate bias effects on TID sensitivity of wide bandgap power devices

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Authors: K. Niskanen , A. D. Touboul, R. Coq Germanicus , A. Michez , F. Wrobel , J. Boch , V. Pouget , F. Saigné

Journal publisher: IEEE RADECS2018

Published year: 2018

DOI identifier: 10.5281/zenodo.2652367