Neutron-Induced Failure Dependence on Reverse Gate Voltage for SiC Power MOSFETs in Atmospheric Environment

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: Kimmo Niskanen; R. Coq Germanicus; A. Michez; Frédéric Wrobel; Jerome Boch; Frédéric Saigné; Antoine Touboul

Journal title: "IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2021, 68 (8), pp.1623-1632. ⟨10.1109/tns.2021.3077733⟩"

Journal number: 8

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2021

DOI identifier: 10.1109/tns.2021.3077733

ISSN: 0018-9499