SEU characterization of commercial and custom-designed SRAMs based on 90 nm technology and below

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Authors: Andrea Coronetti, Matteo Cecchetto, Jialei Wang, Maris Tali, Pablo Fernandez Martinez, Maria Kastriotou, Athina Papadopoulou, Kacper Bilko, Florent Castellani, Mario Sacristan, Ruben Garcia Alia, Carlo Cazzaniga, Yolanda Morilla, Pedro Martin-Holgado, Marc-Jan van Goethem, Harry Kiewiet, Emil van der Graaf, Sytze Brandenburg, Wojtek Hajdas, Laura Sinkunaite, Miroslaw Marszalek, Heikki Kettunen, Mi

Journal title: 2020 IEEE Radiation Effects Data Workshop (in conjunction with 2020 NSREC)

Journal publisher: IEEE

Published year: 2020

Published pages: 1-8

DOI identifier: 10.1109/redw51883.2020.9325822

ISBN: 978-1-6654-1532-3