Exploiting Transistor Folding Layout as RHBD Technique Against Single-Event Transients

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Authors: Y. Q. Aguiar, F. Wrobel, J.-L. Autran, F. L. Kastensmidt, P. Leroux, F. Saigne, V. Pouget, A. D. Touboul

Journal title: IEEE Transactions on Nuclear Science

Journal number: 67/7

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2020

Published pages: 1581-1589

DOI identifier: 10.1109/tns.2020.3003166

ISSN: 0018-9499