Study of SEU Sensitivity of SRAM-Based Radiation Monitors in 65-nm CMOS

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Authors: Jialei Wang, Jeffrey Prinzie, Andrea Coronetti, S. Thys, Ruben Garcia Alia, Paul Leroux

Journal title: IEEE Transactions on Nuclear Science

Journal number: 68/5

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2021

Published pages: 913-920

DOI identifier: 10.1109/tns.2021.3072328

ISSN: 0018-9499