Radiation Hardness Assurance Through System-Level Testing: Risk Acceptance, Facility Requirements, Test Methodology, and Data Exploitation

This is a publication. If there is no link to the publication on this page, you can try the pre-formated search via the search engines listed on this page.

Authors: Andrea Coronetti, Ruben Garcia Alia, Jan Budroweit, Tomasz Rajkowski, Israel Da Costa Lopes, Kimmo Niskanen, Daniel Soderstrom, Carlo Cazzaniga, Rudy Ferraro, Salvatore Danzeca, Julien Mekki, Florent Manni, David Dangla, Cedric Virmontois, Nourdine Kerboub, Alexander Koelpin, Frederic Saigne, Pierre Wang, Vincent Pouget, Antoine Touboul, Arto Javanainen, Heikki Kettunen, Rosine Coq Germanicus

Journal title: IEEE Transactions on Nuclear Science

Journal number: 68/5

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2021

Published pages: 958-969

DOI identifier: 10.1109/tns.2021.3061197

ISSN: 0018-9499