Summary
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Authors: Maria V. Maigler, Miguel Holgado, Maria Fe Laguna, Francisco J. Sanza, Beatriz Santamaria, Alvaro Lavin, Rocio L. Espinosa
Journal title: IEEE Transactions on Instrumentation and Measurement
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2018
Published pages: 1-7
DOI identifier: 10.1109/tim.2018.2876073
ISSN: 0018-9456