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Authors: Yosef Moatti, Eran Rom, Raul Gracia-Tinedo, Dalit Naor, Doron Chen, Josep Sampe, Marc Sanchez-Artigas, Pedro Garcia-Lopez, Filip Gluszak, Eric Deschdt, Francesco Pace, Daniele Venzano, Pietro Michiardi
Journal title: 2017 IEEE 33rd International Conference on Data Engineering (ICDE)
Journal publisher: IEEE
Published year: 2017
Published pages: 309-320
DOI identifier: 10.1109/icde.2017.243
ISBN: 978-1-5090-6543-1