3D-printed optical probes for wafer-level testing of photonic integrated circuits

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Authors: Mareike Trappen, Matthias Blaicher, Philipp-Immanuel Dietrich, Colin Dankwart, Yilin Xu, Tobias Hoose, Muhammad Rodlin Billah, Amin Abbasi, Roel Baets, Ute Troppenz, Michael Theurer, Kerstin Wörhoff, Moritz Seyfried, Wolfgang Freude, Christian Koos

Journal title: Optics Express

Journal number: 28/25

Journal publisher: Optical Society of America

Published year: 2020

Published pages: 37996

DOI identifier: 10.1364/oe.405139

ISSN: 1094-4087