3D-Printed Optics for Wafer-Scale Probing

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Authors: Mareike Trappen, Matthias Blaicher, Philipp-Immanuel Dietrich, Tobias Hoose, Yilin Xu, Muhammad Rodlin Billah, Wolfgang Freude, Christian Koos

Journal title: 2018 European Conference on Optical Communication (ECOC)

Journal number: 23-27 Sept. 2018

Journal publisher: IEEE

Published year: 2018

Published pages: 1-3

DOI identifier: 10.1109/ecoc.2018.8535123

ISBN: 978-1-5386-4862-9