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Authors: Bryan Donyanavard, Amir M. Rahmani, Tiago Muck, Kasra Moazemmi, Nikil Dutt
Journal title: 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE)
Journal publisher: IEEE
Published year: 2018
Published pages: 921-924
DOI identifier: 10.23919/DATE.2018.8342141
ISBN: 978-3-9819263-0-9