Self-Awareness in Systems on Chip— A Survey

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Authors: Axel Jantsch, Nikil Dutt, Amir M. Rahmani

Journal title: IEEE Design & Test

Journal number: 34/6

Journal publisher: IEEE Computer Society

Published year: 2017

Published pages: 8-26

DOI identifier: 10.1109/mdat.2017.2757143

ISSN: 2168-2356