Critical thickness phenomenon in single-crystalline wires under torsion

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Authors: Dabiao Liu, Xu Zhang, Yuan Li, D.J. Dunstan

Journal title: Acta Materialia

Journal number: 150

Journal publisher: Elsevier BV

Published year: 2018

Published pages: 213-23

DOI identifier: 10.1016/j.actamat.2018.03.022

ISSN: 1359-6454