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Authors: Montserrat Fernandez-Bolanos, Andrei Muller, Josef Weber, Peter Ramm
Journal title: 2018 Symposium on Design, Test, Integration & Packaging of MEMS and MOEMS (DTIP)
Journal publisher: IEEE
Published year: 2018
Published pages: 1-5
DOI identifier: 10.1109/DTIP.2018.8394203
ISBN: 978-1-5386-6199-4