New method for individual electrical characterization of stacked SOI nanowire MOSFETs

Summary

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Authors: Bruna Cardoso Paz, Mikael Casse, Sylvain Barraud, Gilles Reimbold, Maud Vinet, Olivier Faynot, Marcelo Antonio Pavanello

Journal title: 2017 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)

Journal publisher: IEEE

Published year: 2017

Published pages: 1-3

DOI identifier: 10.1109/s3s.2017.8309237

ISBN: 978-1-5386-3766-1