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Authors: L. Filipovic, R.L. de Orio, W.H. Zisser, S. Selberherr
Journal title: 2017 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)
Journal publisher: IEEE
Published year: 2017
Published pages: 161-164
DOI identifier: 10.23919/sispad.2017.8085289
ISBN: 978-4-86348-610-2
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