A Simple Interpolation Model for the Carrier Mobility in Trigate and Gate-All-Around Silicon NWFETs

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Authors: Zaiping Zeng, Francois Triozon, Sylvain Barraud, Yann-Michel Niquet

Journal title: IEEE Transactions on Electron Devices

Journal number: 64/6

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2017

Published pages: 2485-2491

DOI identifier: 10.1109/ted.2017.2691406

ISSN: 0018-9383