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Authors: Salim Berrada, Jaehyun Lee, Hamilton Carrillo-Nunez, Cristina Medina-Bailon, Fikru Adamu-Lema, Vihar Georgiev, Pr Asen Asenov
Journal title: 2018 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)
Journal publisher: IEEE
Published year: 2018
Published pages: 244-247
DOI identifier: 10.1109/sispad.2018.8551638
ISBN: 978-1-5386-6790-3
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