Electrical characterization of vertically stacked p-FET SOI nanowires

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Authors: Bruna Cardoso Paz, Mikaël Cassé, Sylvain Barraud, Gilles Reimbold, Maud Vinet, Olivier Faynot, Marcelo Antonio Pavanello

Journal title: Solid-State Electronics

Journal number: 141

Journal publisher: Pergamon Press Ltd.

Published year: 2018

Published pages: 84-91

DOI identifier: 10.1016/j.sse.2017.12.011

ISSN: 0038-1101