Impact of the Effective Mass on the Mobility in Si Nanowire Transistors

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Authors: Cristina Medina-Bailon, Toufik Sadi, Mihail Nedjalkov, Jaehyun Lee, Salim Berrada, Hamilton Carrillo-Nunez, Vihar P. Georgiev, Siegfried Selberherr, Asen Asenov

Journal title: 2018 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)

Journal publisher: IEEE

Published year: 2018

Published pages: 297-300

DOI identifier: 10.1109/sispad.2018.8551630

ISBN: 978-1-5386-6790-3