Challenges & opportunities in low-code testing

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Authors: Faezeh Khorram, Jean-Marie Mottu, Gerson Sunyé

Journal title: Proceedings of the 23rd ACM/IEEE International Conference on Model Driven Engineering Languages and Systems: Companion Proceedings

Journal number: Yearly

Journal publisher: ACM

Published year: 2020

Published pages: 1-10

DOI identifier: 10.1145/3417990.3420204

ISBN: 9781450381352