Reparameterization Gradients through Acceptance-Rejection Sampling Algorithms

Summary

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Authors: Christian A. Naesseth, Francisco J. R. Ruiz, Scott W. Linderman, and David M. Blei

Journal title: International Conference on Artificial Intelligence and Statistics

Journal number: 54

Journal publisher: Proceedings of Machine Learning Research (PMLR)

Published year: 2017

Published pages: 489-498