Threshold Profiling for Wideband Ranging

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Authors: Stefania Bartoletti, Andrea Conti, Wenhan Dai, Moe Z. Win

Journal title: IEEE Signal Processing Letters

Journal number: 25/6

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2018

Published pages: 873-877

DOI identifier: 10.1109/LSP.2018.2815692

ISSN: 1070-9908