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Authors: Senni, Luca; Laureti, Stefano; Rizwan, Muhammad Khalid; Burrascano, Pietro; Hutchins, David A.; Davis, Lee. A. J.; Ricci, Marco
Journal title: NDT & E International
Journal number: 102
Journal publisher: Elsevier BV
Published year: 2019
Published pages: 281-286
DOI identifier: 10.5281/zenodo.4432042
ISSN: 0963-8695
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