Investigation of layer interface model of multi-layer structure using semi-analytical and FEM analysis for eddy current pulsed thermography

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Authors: Qiuji Yi, GuiYun Tian, Houssem Chebbi, Denis Premel

Journal title: 2020 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)

Journal publisher: IEEE

Published year: 2020

Published pages: 1-5

DOI identifier: 10.1109/I2MTC43012.2020.9128878

ISBN: 978-1-7281-4460-3