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Authors: J. M. Gorriz, J. Ramirez, J. Suckling, Ignacio Alvarez Illan, Andres Ortiz, F. J. Martinez-Murcia, Fermin Segovia, D. Salas-Gonzalez, Shuihua Wang
Journal title: IEEE Access
Journal number: 5
Journal publisher: Institute of Electrical and Electronics Engineers Inc.
Published year: 2017
Published pages: 11468-11478
DOI identifier: 10.1109/ACCESS.2017.2714579
ISSN: 2169-3536