The Devil is in the Details: Whole Slide Image Acquisition and Processing for Artifacts Detection, Color Variation, and Data Augmentation: A Review

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Authors: Neel Kanwal; Fernando Perez-Bueno; Arne Schmidt; Kjersti Engan; Rafael Molina

Journal title: IEEE Access

Journal number: volume: 10

Journal publisher: Institute of Electrical and Electronics Engineers Inc.

Published year: 2022

Published pages: 58821 - 58844

DOI identifier: 10.1109/access.2022.3176091

ISSN: 2169-3536