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Authors: Shay Gueron
Journal title: 2016 Workshop on Fault Diagnosis and Tolerance in Cryptography (FDTC)
Journal number: FDTC 2016
Journal publisher: IEEE
Published year: 2016
Published pages: 1-3
DOI identifier: 10.1109/FDTC.2016.20
ISBN: 978-1-5090-1108-7