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Authors: M. Kain, V. K. Nadimpalli, A. Miqueo, M. C. May, J. A. Yagüe-Fabra, B. Häfner, D. B. Pedersen, M. Calaon, G. Tosello
Journal title: Proceedings of EUSPEN 2020 International Conference
Journal number: Proceedings of EUSPEN 2020 International Conference
Journal publisher: EUSPEN - European Society for Precision Engineering and Nanotechnology
Published year: 2020
DOI identifier: 10.5281/zenodo.4587184
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