Attention Guided Multi-Task Learning for Surface defect identification

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Authors: Vignesh Sampath; Inaki Maurtua; Juan Jose Aguilar Martin; Andoni Rivera; Jorge Molina; Aitor Gutierrez

Journal title: IEEE Transactions on Industrial Informatics

Journal number: 1-9

Journal publisher: Institute of Electrical and Electronics Engineers

Published year: 2023

DOI identifier: 10.1109/tii.2023.3234030

ISSN: 1551-3203