Novel on-resistance based methodology for MOSFET electrical characterization

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Authors: T.A. Karatsori, K. Bennamane, G. Ghibaudo

Journal title: Solid-State Electronics

Journal number: 168

Journal publisher: Pergamon Press Ltd.

Published year: 2020

Published pages: 107722

DOI identifier: 10.1016/j.sse.2019.107722

ISSN: 0038-1101