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Authors: L. Brunet, C. Fenouillet-Beranger, P. Batude, S. Beaurepaire, F. Ponthenier, N. Rambal, V. Mazzocchi, J-B. Pin, P. Acosta-Alba, S. Kerdiles, P. Besson, H. Fontaine, T. Lardin, F. Fournel, V. Larrey, F. Mazen, V. Balan, C. Morales, C. Guerin, V. Jousseaume, X. Federspiel, D. Ney, X. Garros, A. Roman, D. Scevola, P. Perreau, F. Kouemeni-Tchouake, L. Arnaud, C. Scibetta, S. Chevalliez, F. Aussenac, J
Journal title: 2018 IEEE International Electron Devices Meeting (IEDM)
Journal publisher: IEEE
Published year: 2018
Published pages: 7.2.1-7.2.4
DOI identifier: 10.1109/iedm.2018.8614653
ISBN: 978-1-7281-1987-8
- Not specified