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Authors: Pascal Vivet, Gilles Sicard, Laurent Millet, Stephane Chevobbe, Karim Ben Chehida, Luis Angel Cubero, Monte Alegre, Maxence Bouvier, Alexandre Valentian, Maria Lepecq, Thomas Dombek, Olivier Bichler, Sebastien Thuries, Didier Lattard, Cheramy Severine, Perrine Batude, Fabien Clermidy
Journal title: 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE)
Journal publisher: IEEE
Published year: 2019
Published pages: 674-679
DOI identifier: 10.23919/date.2019.8714886
ISBN: 978-3-9819263-2-3
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