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Authors: S. Cheramy, A. Jouve, C. Fenouillet-Beranger, P. Batude, M. Vinet
Journal title: 2018 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)
Journal publisher: IEEE
Published year: 2018
Published pages: 1-5
DOI identifier: 10.1109/s3s.2018.8640158
ISBN: 978-1-5386-7627-1
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