Post-processing of SiO2/Si ion-track template images for pores parameters analysis

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Authors: V. Bundyukova, D. Yakimchuk, E. Shumskaya, A. Smirnov, M. Yarmolich, E. Kaniukov

Journal title: Materials Today: Proceedings

Journal number: 7

Journal publisher: Elsevier BV

Published year: 2019

Published pages: 828-834

DOI identifier: 10.1016/j.matpr.2018.12.081

ISSN: 2214-7853