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Authors: Hannes Ramon, Michiel Verplaetse, Michael Vanhoecke, Haolin Li, Johan Bauwelinck, Peter Ossieur, Xin Yin, Guy Torfs
Journal title: IEEE Journal of Solid-State Circuits
Journal publisher: Institute of Electrical and Electronics Engineers
Published year: 2021
Published pages: 1-1
DOI identifier: 10.1109/jssc.2021.3057575
ISSN: 0018-9200