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Authors: V. Nodjiadjim, M. Riet, C. Mismer, R. Hersent, F. Jorge, A. Konczykowska, J.-Y. Dupuy
Journal title: IEEE Journal of the Electron Devices Society
Journal number: 7
Journal publisher: Institute of Electrical and Electronics Engineers Inc.
Published year: 2019
Published pages: 748-752
DOI identifier: 10.1109/jeds.2019.2928271
ISSN: 2168-6734