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Authors: A. Konczykowska, J.-Y. Dupuy, F. Jorge, M. Riet, V. Nodjiadjim
Journal title: 2018 22nd International Microwave and Radar Conference (MIKON)
Journal publisher: IEEE
Published year: 2018
Published pages: 1-4
DOI identifier: 10.23919/mikon.2018.8514557
ISBN: 978-83-949421-1-3
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