Mechanism of Néel Order Switching in Antiferromagnetic Thin Films Revealed by Magnetotransport and Direct Imaging

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Authors: L. Baldrati, O. Gomonay, A. Ross, M. Filianina, R. Lebrun, R. Ramos, C. Leveille, F. Fuhrmann, T. R. Forrest, F. Maccherozzi, S. Valencia, F. Kronast, E. Saitoh, J. Sinova, M. Kläui

Journal title: Physical Review Letters

Journal number: 123/17

Journal publisher: American Physical Society

Published year: 2019

DOI identifier: 10.1103/physrevlett.123.177201

ISSN: 0031-9007