Trade‐Off Between Data Retention and Switching Speed in Resistive Switching ReRAM Devices

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Authors: Sebastian Siegel, Christoph Baeumer, Alexander Gutsche, Moritz Witzleben, Rainer Waser, Stephan Menzel, Regina Dittmann

Journal title: Advanced Electronic Materials

Journal publisher: Wiley

Published year: 2020

Published pages: 2000815

DOI identifier: 10.1002/aelm.202000815

ISSN: 2199-160X